Capable of detecting fine defects down to approximately 10μm. Contributes to preventing the outflow of defective products and speeding up and reducing the manpower required for inspection work. [Exhibited at the 38th NEPCON Japan]
The "BBMaster Series" is a substrate appearance inspection device that accurately detects even fine defects through advanced image processing using patented proprietary technology.
It can detect defects that are difficult to identify from certain angles, as well as very fine defects, with high precision. We design and manufacture the entire system, including cameras, LED lighting, and dedicated software, so you can rely on us for after-sales support.
【Features】
- A lineup of various models, including those capable of detecting defects as small as approximately 10μm.
- By using different reflective lighting, defects that are not visible from certain angles can also be detected.
- A range of automatic and manual machines available.
- A support system that can accommodate various requests and consultations.
【Inspection Items】
Scratches, missing parts, dents, foreign objects, short circuits, missing components, pattern anomalies, residual dry film, molding defects, disconnections, copper residue, etc.
【Exhibition Information】
Exhibition Name: 38th NEPCON Japan Electronics Development & Manufacturing Show
Dates: January 24 (Wed) - January 26 (Fri), 2024
Venue: Tokyo Big Sight, East Halls 1-3
Booth Number: 17-26
*For product details, please refer to the materials available for download in PDF format.